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This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.

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Author: Joseph Goldstein,Dale E. Newbury,David C. Joy,Charles E. Lyman,Patrick Echlin,Eric Lifshin,Linda C. Sawyer,J.R. Michael
Number of Pages: 689 pages
Published Date: 31 May 2013
Publisher: Springer-Verlag New York Inc.
Publication Country: New York, NY, United States
Language: English
ISBN: 9781461349693
Download Link: Click Here
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